Additive composition of defocusing images in an electron microsc

Radiant energy – Inspection of solids or liquids by charged particles – Electron microscope type

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

250307, H01J 3726

Patent

active

054669375

ABSTRACT:
A method of forming an image in an electron microscope. Because of the oscillating behaviour of the phase contrast transfer function (PCTF), images made by means of an electron microscope are liable to exhibit contrast whereas the object does not exhibit such contrast. In order to counteract these deviations, it is proposed to form sub-images, each sub-image having its own defocusing of the imaging lens and each sub-image being formed with its own weighting factor, and to add said sub-images. A substantially flat variation of the PCTF is achieved by imparting an oscillating dependence as a function of the defocusing to the weighting factor. The invention offers a simple method of image reconstruction from the sub-images in that the value of the oscillating function has the same sign throughout the defocusing range. The desired image can then be obtained by addition of the sub-images on, for example a photographic film.

REFERENCES:
patent: 4514629 (1985-04-01), Smith et al.
patent: 5134288 (1992-07-01), Van Dyjk et al.
Y. Tanigushi et al, "Active Image Processing as Applied to High Resolution Electron Microscopy [I] Assessment of Misalignment and its Correction", J. Electron Microsc., vol. 39, No. 3, 1990, pp. 137-144.
P. Bonhomme & A. Beorchia, "Image Synthesis In The Electron Microscope", Ultramicroscopy 17, 1985, pp. 127-131.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Additive composition of defocusing images in an electron microsc does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Additive composition of defocusing images in an electron microsc, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Additive composition of defocusing images in an electron microsc will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1222968

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.