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mark position detecting apparatus

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Mark position detecting method and apparatus

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Mark position detecting method and device for aligner and aligne

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Mark position detecting system and method for detecting mark...

Optics: measuring and testing – Position or displacement
Reexamination Certificate

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Mark position detection apparatus

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Mark position determining apparatus for use in exposure system

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Mark position measuring method and apparatus

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Mark position measuring method and apparatus

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Marker structure for optical alignment of a substrate, a...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Marker structure, mask pattern, alignment method and...

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Marker used for measuring displacement of moving object and...

Optics: measuring and testing – Position or displacement – Position transverse to viewing axis
Reexamination Certificate

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Marking and authenticating documents with liquid crystal materia

Optics: measuring and testing – Document pattern analysis or verification
Patent

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Mask aligner having a photo-mask setting device

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Mask alignment for semiconductor processing

Optics: measuring and testing – By alignment in lateral direction
Patent

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Mask alignment system

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Mask alignment system for components with extremely sensitive su

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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Mask analysis

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Mask and wafer diffraction grating alignment system wherein the

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

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Mask defect inspecting method, semiconductor device...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Mask defect inspection apparatus

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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