Mark position measuring method and apparatus

Optics: measuring and testing – By alignment in lateral direction – With registration indicia

Reexamination Certificate

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Reexamination Certificate

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10912100

ABSTRACT:
A method of measuring a position of a mark in a chamber in which a pressure inside the chamber is different from a pressure outside the chamber. The method includes a first detection step of detecting a reference mark fixedly disposed in the chamber, through a window arranged on the chamber, using a detector disposed outside the chamber, a second detection step of detecting the mark movable with respect to the reference mark in the chamber through the window using the detector, and a calculation step of calculating a position of the mark with respect to the reference mark based on detection results of the first and second detection steps, so as to suppress a detection error caused by at least one of deformations of the chamber and the window, in which at least one deformation is due to a difference between the pressure inside the chamber and the pressure outside the chamber.

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patent: 5309197 (1994-05-01), Mori et al.
patent: 5671057 (1997-09-01), Kawai
patent: 6774374 (2004-08-01), Driessen et al.
patent: 7126689 (2006-10-01), Nishi
patent: 2001/0006413 (2001-07-01), Burghoorn
patent: 2001/0046037 (2001-11-01), Ota et al.
patent: 2002/0196421 (2002-12-01), Tanaka et al.
patent: 2003/0095241 (2003-05-01), Burghorn
patent: 5-198471 (1993-08-01), None

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