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Wafer alignment device

Optics: measuring and testing – By alignment in lateral direction – With light detector
Patent

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Wafer alignment sensor

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Wafer alignment sensor using a phase-shifted microlens array

Optics: measuring and testing – By alignment in lateral direction – With light detector
Reexamination Certificate

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Wafer alignment system

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Wafer alignment system using parallel imaging detection

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

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Wafer and stage alignment using photonic devices

Optics: measuring and testing – Position or displacement – Position transverse to viewing axis
Reexamination Certificate

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Wafer center finding with charge-coupled devices

Optics: measuring and testing – Position or displacement
Reexamination Certificate

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Wafer chuck illumination device for use in semiconductor...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Wafer chuck illumination device for use in semiconductor...

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Wafer chuck with integrated reference sample

Optics: measuring and testing – Sample – specimen – or standard holder or support
Reexamination Certificate

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Wafer chuck with integrated reference sample

Optics: measuring and testing – Sample – specimen – or standard holder or support
Reexamination Certificate

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Wafer defect detection methods and systems

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Wafer defect detection system with traveling lens multi-beam...

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

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Wafer defect measuring method and apparatus

Optics: measuring and testing – Inspection of flaws or impurities
Reexamination Certificate

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Wafer detecting device

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Wafer detecting device

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Wafer detection apparatus

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Wafer diameter/sectional shape measuring machine

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Wafer edge inspection

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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Wafer edge inspection

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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