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IC die analysis via back side lens

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition
Reexamination Certificate

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IC package inspection apparatus

Optics: measuring and testing – Inspection of flaws or impurities – Having predetermined light transmission regions
Patent

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ICP-OES and ICP-MS induction current

Optics: measuring and testing – By dispersed light spectroscopy – With sample excitation
Reexamination Certificate

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Identical servo frequency modulated passive ring laser gyroscope

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

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Identification and classification device and process practiced w

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Identification and labeling of beam images of a structured...

Optics: measuring and testing – Position or displacement
Reexamination Certificate

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Identification and quantificaation of refrigerants

Optics: measuring and testing – By dispersed light spectroscopy
Patent

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Identification card, sensor, and system

Optics: measuring and testing – Document pattern analysis or verification
Patent

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Identification medium, article, identification device, and...

Optics: measuring and testing – Document pattern analysis or verification
Reexamination Certificate

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Identification of connector terminals

Optics: measuring and testing – By shade or color
Patent

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Identification of gemstones by relative reflectance measurements

Optics: measuring and testing – Crystal or gem examination
Patent

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Identification of material inclusions in pulp and paper...

Optics: measuring and testing – By dispersed light spectroscopy – With raman type light scattering
Reexamination Certificate

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Identification of particles in fluid

Optics: measuring and testing – By particle light scattering
Reexamination Certificate

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Identification of particles in fluid

Optics: measuring and testing – By particle light scattering – With photocell detection
Reexamination Certificate

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Identification particles and system and method for...

Optics: measuring and testing – Document pattern analysis or verification
Reexamination Certificate

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Identification system for an article having individually attache

Optics: measuring and testing – Document pattern analysis or verification
Patent

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Identification system using regions of predetermined properties

Optics: measuring and testing – Document pattern analysis or verification
Patent

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Identifier of location of tray

Optics: measuring and testing – For light transmission or absorption – Of fluent material
Patent

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Identifying a polarization-mode dispersion event

Optics: measuring and testing – For optical fiber or waveguide inspection
Reexamination Certificate

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Identifying and compensating for slip-plane dislocations in phot

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Patent

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