4. Optics: measuring and testing
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Volumetric measurement of particles

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Wafer diameter/sectional shape measuring machine

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Wafer pattern defect detection method and apparatus therefor

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Wavelength measuring system

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Width measurement of an image-bearing sheet

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Reexamination Certificate

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Window contamination detector

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Wiper control apparatus

Optics: measuring and testing – By configuration comparison
Patent

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Wiring pattern line width measuring apparatus

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Workpiece identification apparatus

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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