Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent
1999-01-26
2000-07-25
Kim, Robert H.
Optics: measuring and testing
By configuration comparison
With comparison to master, desired shape, or reference voltage
356328, G01B 1100
Patent
active
060942711
ABSTRACT:
A wavelength measuring system includes a lens for converting an outgoing light beam from an input fiber into parallel light rays, a first wavelength dispersion element disposed on the optical axis of the parallel light rays for spectral diffraction of the parallel light rays and a second wavelength dispersion element disposed opposite to the first wavelength dispersion element so as to allow the parallel light rays, after spectral diffraction by the first wavelength dispersion element, to fall thereon. A right-angle reflecting prism divides the parallel light rays from the second wavelength dispersion element into two reflected light beams. First and second optical receivers receive the reflected light beams from the right-angle reflecting prism, respectively, and a signal processing circuit processes signals from the first and second optical receivers, respectively, thereby determining the wavelength of an incoming light beam for measurement. Thus, the wavelength measuring system is compact in size and low in cost. The wavelength measuring system has no movable mechanical parts, and does not require software for data processing when measuring the wavelength of a light wave oscillating in a single mode and in a wide wavelength range at a light source.
REFERENCES:
patent: 5275168 (1994-01-01), Reintjes et al.
patent: 5796479 (1998-08-01), Derickson et al.
Ando Electric Co. Ltd.
Kim Robert H.
Nguyen Tu T.
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