Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent
1981-01-02
1982-11-23
Knowles, Allen N.
Optics: measuring and testing
By configuration comparison
With comparison to master, desired shape, or reference voltage
235 92DN, 235 92CA, 356376, 356398, 250559, 250223R, 364556, G01B 1100
Patent
active
043602746
ABSTRACT:
Workpiece identification apparatus for use in identifying to which of a number of predetermined types a workpiece belongs. The apparatus scans workpieces to be learnt and calculates a set of parameters of each workpiece. After scanning all the workpieces to be learnt, the apparatus selects a sub-set of the parameters such that the sub-set is unique for each learnt workpiece with an allowance for a selected number of parameters to be erroneously determined. The apparatus then scans workpieces to be identified and calculates an equivalent sub-set of parameters thereof and identifies the workpiece by comparing this sub-set with the learnt sub-sets.
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patent: 4298285 (1981-11-01), Ito
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"Control Devices and Systems," Control Engineering, vol. 20, Jun. 1973.
Knowles Allen N.
USM Corporation
White William F.
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