Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent
1987-07-06
1988-10-04
Rosenberger, R. A.
Optics: measuring and testing
By configuration comparison
With photosensitive film or plate
356386, G01B 1102
Patent
active
047752360
ABSTRACT:
A device for measuring an object includes a laser beam, a translator for moving the object with respect to the beam, an object reference plane which is the plane perpendicular to the beam that is first entered by the object, a lens system for imaging a light pattern formed in a second plane onto a first plane, wherein the second plane is adjacent to the object reference plane, and the light pattern includes a diffraction pattern caused by interaction of the beam and the object, a slit interposed at the first plane for limiting the extent of the beam that passes through the first plane, and a photodetector that emits a signal representative of the light received behind the slit for detecting the portion of the beam that passes through this slit. The slit is sufficiently small so as to enable resolution of the diffraction pattern by the photodetector. The device further includes a circuit for calculating a dimension of the object in response to the signal emitted by the photodetector. A method of gauging roundness includes using this device for moving the object in a direction perpendicular to the beam and rotating the object within the beam.
REFERENCES:
patent: 3980141 (1969-11-01), Rock, Jr.
patent: 4007992 (1977-02-01), Petrohilo et al.
patent: 4063103 (1977-12-01), Sumi
patent: 4097158 (1978-06-01), Dehait
Cohen David A.
Papurt David M.
Cooper Crystal
Laser Metric Systems, Inc.
Rosenberger R. A.
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