Optics: measuring and testing – By configuration comparison
Patent
1997-08-11
1999-08-03
Kim, Robert H.
Optics: measuring and testing
By configuration comparison
2503381, G01B 1100, G01J 500
Patent
active
059332417
ABSTRACT:
A calibration system in which calibration target illuminates the IR sensor with at least two distinct inputs spaced apart in time approximately equal to the time it takes the IR sensor to scan an image of the target across the IR sensor field of response.
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Kim Robert H.
Lockheed Martin Corporation
Stafira Michael P.
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