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Self-test and correction of loss of charge errors in a flash...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Self-test circuit and memory device incorporating it

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Self-test electronic assembly and test system

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate

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Self-test electronic assembly and test system

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate

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Self-test of a memory device

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Patent

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Self-test RAM using external synchronous clock

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Patent

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Self-test RAM using external synchronous clock

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Self-test ram using external synchronous clock

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Self-test ram using external synchronous clock

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Self-testing and -repairing fault-tolerance infrastructure...

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate

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Self-testing circuit in semiconductor memory device

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate

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Self-testing of DRAMs for multiple faults

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Self-testing of magneto-resistive memory arrays

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Self-throttling error-correction buffer and method for a...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital data error correction
Reexamination Certificate

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Self-timed AC CIO wrap method and apparatus

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Self-timed reliability and yield vehicle with gated data and...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Self-verification of configuration memory in programmable...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Self-verification of configuration memory in programmable...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Self-verification of configuration memory in programmable...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Semantic error diagnostic process for multi-agent systems

Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
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