Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2006-11-14
2006-11-14
Tsai, Carol S. W. (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C327S040000, C714S719000, C324S765010
Reexamination Certificate
active
07136771
ABSTRACT:
A testing circuit includes m block test units and a first logical processing unit. The block test unit compares a first data outputted from a test object with a reference data, and outputs a result as a test circuit output signal based on a output control signal. The first logical processing unit judges whether the all of the m test circuit output signals indicate that the first data is coincident with the reference data, and outputs a result as a total judgment result signal based on the m test circuit output signals. The block test unit includes a block judging unit and a block output selecting unit. The block judging unit compares the first data with the reference data to judge whether the first data is coincident with the reference data, and outputs a result as a block judgment result signal.
REFERENCES:
patent: 6094735 (2000-07-01), Cole et al.
patent: 6182255 (2001-01-01), Ohtomo
patent: 6636998 (2003-10-01), Lee et al.
patent: 6856158 (2005-02-01), Frame et al.
patent: 6978405 (2005-12-01), Sellmair
patent: 2001-155500 (2001-06-01), None
NEC Electronics Corporation
Tsai Carol S. W.
Young & Thompson
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