Data processing: measuring – calibrating – or testing – Testing system – Of circuit
Reexamination Certificate
2006-05-23
2006-05-23
Hoff, Marc S. (Department: 2857)
Data processing: measuring, calibrating, or testing
Testing system
Of circuit
C327S376000, C327S377000
Reexamination Certificate
active
07050920
ABSTRACT:
A method for testing an output circuit of a semiconductor device including a plurality of output circuits includes the step of turning ON p-ch and n-ch MIS transistors of a subject output circuit, turning ON and OFF one and the other, respectively, of p-ch and n-ch MIS transistors of another output circuit used as a reference output circuit, measuring the potential difference between the output terminal of the subject output circuit and the output terminal of the reference output circuit and the penetrating current of the subject output circuit, and calculating the ON-resistance of the p-ch or n-ch transistor of the subject output circuit.
REFERENCES:
patent: 5006809 (1991-04-01), Mang et al.
patent: 5371457 (1994-12-01), Lipp
patent: 5420525 (1995-05-01), Maloberti et al.
patent: 5570259 (1996-10-01), Allmeier et al.
patent: 5708606 (1998-01-01), Tanzawa et al.
patent: 5808502 (1998-09-01), Hui et al.
patent: 5875103 (1999-02-01), Bhagwat et al.
patent: 6100830 (2000-08-01), Dedic
patent: 6313657 (2001-11-01), Hashimoto
patent: 6833722 (2004-12-01), Cirkel et al.
patent: 11-30649 (1999-02-01), None
patent: 2000-214225 (2000-08-01), None
Charioui Mohamed
Elpida Memory Inc.
Hoff Marc S.
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