Semiconductor device having a mode of functional test

Details Semiconductor device having a mode of functional test Semiconductor device having a mode of functional test

2006-04-18

2006-04-18

Hoff, Marc S. (Department: 2857)

Data processing: measuring, calibrating, or testing

Testing system

Of circuit

C702S079000, C702S120000, C702S176000, C714S726000, C716S030000

Reexamination Certificate

active

07031864

ABSTRACT:
A semiconductor device including a first signal path for guiding an input signal from a first pad to an input terminal of a macro cell; a second signal path for guiding a clock from a second pad to a clock input terminal of the macro cell; a third signal path for guiding an output signal from a signal output terminal of the macro cell to a third pad; and a fourth signal path for receiving the clock from the first signal path and guiding the clock to a fourth pad. It is possible to eliminate wiring delay by measuring the time from when the input signal and the clock are supplied by the first and second pads until the output signal is output by the third pad, and the time from when the clock is supplied to the second path until it is output by the fourth pad.

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