Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2005-06-28
2008-12-16
Do, Thuan (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C716S030000, C716S030000
Reexamination Certificate
active
07467362
ABSTRACT:
A failure detection improvement apparatus that modifies a net list comprises; a net list input section to which the net list is input; a circuit modification section that adds an observation FF to an appropriate location on the net list; and a net list output section that outputs the net list that has been modified by the circuit modification section.
REFERENCES:
patent: 5812561 (1998-09-01), Giles et al.
patent: 6957403 (2005-10-01), Wang et al.
patent: 4-271437 (1992-09-01), None
patent: 2-59967 (1996-02-01), None
patent: 2773148 (1998-07-01), None
patent: 2000-148813 (2000-05-01), None
Honma Yasutomo
Makishima Hiromichi
Shigihara Seiji
Do Thuan
Fujitsu Limited
Staas & Halsey , LLP
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