4. Computer-aided design and analysis of circuits and semiconductor
  5. Design of semiconductor mask or reticle
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Parameter adjustment method, semiconductor device...

Computer-aided design and analysis of circuits and semiconductor – Design of semiconductor mask or reticle – Manufacturing optimizations
Reexamination Certificate

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Pattern forming method and system, and method of...

Computer-aided design and analysis of circuits and semiconductor – Design of semiconductor mask or reticle
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Pattern management method and pattern management program

Computer-aided design and analysis of circuits and semiconductor – Design of semiconductor mask or reticle – Analysis and verification
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Pattern signature

Computer-aided design and analysis of circuits and semiconductor – Design of semiconductor mask or reticle – Analysis and verification
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Pattern verification method, program thereof, and...

Computer-aided design and analysis of circuits and semiconductor – Design of semiconductor mask or reticle – Analysis and verification
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Pattern-driven routing

Computer-aided design and analysis of circuits and semiconductor – Design of semiconductor mask or reticle – Analysis and verification
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Pattern-producing method for semiconductor device

Computer-aided design and analysis of circuits and semiconductor – Design of semiconductor mask or reticle – Analysis and verification
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Performance-aware logic operations for generating masks

Computer-aided design and analysis of circuits and semiconductor – Design of semiconductor mask or reticle – Layout generation
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Photomask management method and photomask wash limit...

Computer-aided design and analysis of circuits and semiconductor – Design of semiconductor mask or reticle
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Photomask manufacturing method and semiconductor device...

Computer-aided design and analysis of circuits and semiconductor – Design of semiconductor mask or reticle
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Process-model generation method, computer program product,...

Computer-aided design and analysis of circuits and semiconductor – Design of semiconductor mask or reticle – Analysis and verification
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