Pattern signature

Details Pattern signature Pattern signature

2011-03-08

2011-03-08

Dinh, Paul (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Design of semiconductor mask or reticle

Analysis and verification

C716S050000, C716S051000, C716S055000, C716S056000, C716S136000, C430S005000, C430S030000, C382S144000, C382S145000

Reexamination Certificate

active

07904853

ABSTRACT:
A method, system, and computer program product are disclosed for generating a pattern signature to represent a pattern in an integrated circuit design. In one approach, the method, system and computer program product transform pattern data, two dimensional data for the pattern, into a set of one dimensional mathematical functions, compress the set of one dimensional mathematical functions into a single variable function, compress the single variable function by calculating a set of values for the single variable function, and generate a pattern signature for the pattern from the set of values.

REFERENCES:
patent: 5815685 (1998-09-01), Kamon
patent: 6187483 (2001-02-01), Capodieci et al.
patent: 6453274 (2002-09-01), Kamon
patent: 6883158 (2005-04-01), Sandstrom et al.
patent: 7386162 (2008-06-01), Dakshina-Murthy et al.
patent: 7403265 (2008-07-01), Tinnemans et al.
patent: 7444616 (2008-10-01), Sandstrom et al.
patent: 7512927 (2009-03-01), Gallatin et al.
patent: 7530048 (2009-05-01), Joshi
patent: 7566517 (2009-07-01), Adel et al.
patent: 7646906 (2010-01-01), Saidin et al.
patent: 7689966 (2010-03-01), Verma et al.
patent: 7695876 (2010-04-01), Ye et al.
patent: 7739651 (2010-06-01), Melvin et al.
patent: 2004/0003357 (2004-01-01), Palusinski et al.
patent: 2004/0086197 (2004-05-01), Fletcher et al.
patent: 2005/0251771 (2005-11-01), Robles
patent: 2006/0228041 (2006-10-01), Joshi
patent: 2006/0277520 (2006-12-01), Gennari
Genarri, Frank E. et al., “A Pattern Matching System for Linking TCAD and EDA.” Proceedings of the 5th International Symposium on Quality electronic Design, pp. 165-170, 2004.
Roseboom, E. et al., “Automated Full-Chip Hotspot Detection and Removal Flow for Interconnect Layers of Cell-Based Designs.” SPIE 2007.
Non-Final Office Action dated Oct. 4, 2010 for U.S. Appl. No. 11/952,912.

Affiliated with

Also associated with

Rating

Pattern signature does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Pattern signature, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Pattern signature will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2663961