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Test structures for electrically detecting back end of the...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Test structures for identifying open contacts and methods of...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Test structures for monitoring gate oxide defect densities and t

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Test structures for monitoring gate oxide defect densities...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Test structures for stacking dies having through-silicon vias

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Test structures for substrate etching

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Test tray with carrier modules for a semiconductor device...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Test vehicle with zig-zag structures

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Test wafer and method for producing the test wafer

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Testable substrate and a testing method

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Testchip design for process analysis in sub-micron DRAM fabricat

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Testing for correct undercutting of an electrode during an...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Testkey design pattern for gate oxide

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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TFT-LCD device having a reduced feed-through voltage

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Thermal interface

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Thin film CMOS calibration standard having protective cover...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Thin film transistor substrate with testing circuit

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Topography monitor

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Transient fuse for change-induced damage detection

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Transistor for checking radiation-hardened transistor

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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