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Probe look ahead: testing parts not currently under a probehead

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Probe needle test apparatus and method

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Probe testing structure

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Probe unit and its manufacturing method

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Process and structure for measuring the planarity degree of a di

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Process variation monitor for integrated circuits

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Process via mismatch detecting device

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Random number generating device

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Random number generating device

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Random number generating device

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Real-time monitoring of particles in semiconductor vacuum...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Real-time monitoring of particles in semiconductor vacuum...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Reduced terminal testing system

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Reduced terminal testing system

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Reduced terminal testing system

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Reduced terminal testing system

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Repairable multichip module

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Patent

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Resistance defect assessment device, resistance defect...

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate

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Reticle and method of fabricating semiconductor device

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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Reticle for wafer test structure areas

Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
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