Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate
2008-06-20
2009-12-08
Louie, Wai-Sing (Department: 2814)
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
C257S104000, C257SE21521
Reexamination Certificate
active
07629609
ABSTRACT:
The objective is to provide a random number generating device having a smaller circuit size and a smaller value of output bias. The random number generating device includes a pair of first and second current paths arranged in parallel with each other, and a pair of first and second fine particles, which can mutually exchange charges, and are located in the vicinity of the first and second current paths.
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Fujita Shinobu
Tanamoto Tetsufumi
Kabushiki Kaisha Toshiba
Louie Wai-Sing
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
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