Active solid-state devices (e.g. – transistors – solid-state diode – Test or calibration structure
Reexamination Certificate
2005-05-03
2005-05-03
Graybill, David E. (Department: 2827)
Active solid-state devices (e.g., transistors, solid-state diode
Test or calibration structure
C257S737000, C257S739000, C361S748000
Reexamination Certificate
active
06888158
ABSTRACT:
A bare chip carrier for holding a bare chip includes a bare chip carrier base member, a bump electrode which is located above a principal surface of the bare chip carrier base member and which is to be connected to a pad electrode of the bare chip, a bare chip carrier electrode which is formed on a back surface of the bare chip carrier base member and which has a recessed portion, and a wiring that connects the bump electrode to the bare chip carrier electrode.
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Graybill David E.
McDermott & Will & Emery
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