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X-ray monitoring

X-ray or gamma ray systems or devices – Specific application – Absorption
Reexamination Certificate

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X-ray monitoring

X-ray or gamma ray systems or devices – Specific application – Absorption
Reexamination Certificate

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X-ray monitoring system

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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X-ray monochromator

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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X-ray monochromator and spectral measurement apparatus using the

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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X-ray multi-layer mirror and x-ray exposure apparatus

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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X-ray multichannel spectrometer

X-ray or gamma ray systems or devices – Specific application – Fluorescence
Reexamination Certificate

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X-ray needle providing heating with microwave energy

X-ray or gamma ray systems or devices – Specific application – Absorption
Patent

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X-ray optical apparatus and device fabrication method

X-ray or gamma ray systems or devices – Specific application – Lithography
Patent

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X-ray optical device and multilayer mirror for small angle...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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X-ray optical element

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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X-ray optical element and diffractometer with a soller slit

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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X-ray optical element and method for its manufacture

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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X-ray optical element including a multilayer coating

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent

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X-ray optical system

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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X-ray optical system

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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X-ray optical system and method for imaging a source

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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X-ray optical system and X-ray exposure apparatus

X-ray or gamma ray systems or devices – Specific application – Lithography
Reexamination Certificate

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X-ray optical system with adjustable convergence

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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X-ray optical system with wobble device

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate

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