LandOfFree - US Patents - Listing for X-ray or gamma ray systems or devices,Specific application

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Back-reflection X-ray crystallography method and system

X-ray or gamma ray systems or devices – Specific application – Computerized tomography

Backprojection for x-ray CT system

X-ray or gamma ray systems or devices – Specific application – Computerized tomography

Backprojection method and X-ray CT apparatus

X-ray or gamma ray systems or devices – Specific application – Computerized tomography

Backprojection methods and apparatus for computed tomography...

X-ray or gamma ray systems or devices – Specific application – Computerized tomography

Backprojection reconstruction method for CT imaging

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Backscatter imaging using Hadamard transform masking

X-ray or gamma ray systems or devices – Specific application – Absorption

Backscatter inspection portal

X-ray or gamma ray systems or devices – Specific application – Absorption

Backscatter inspection portal

X-ray or gamma ray systems or devices – Specific application – Absorption

Bad pixel column processing in a radiation detection panel

X-ray or gamma ray systems or devices – Specific application – Absorption

Baggage inspection and the like

X-ray or gamma ray systems or devices – Specific application – Absorption

Baggage inspection conveyor baffle and method

X-ray or gamma ray systems or devices – Specific application – Absorption

Baggage inspection system

X-ray or gamma ray systems or devices – Specific application – Absorption

Baggage inspection system

X-ray or gamma ray systems or devices – Specific application – Absorption

Ball grid array re-work assembly with X-ray inspection system

X-ray or gamma ray systems or devices – Specific application – Absorption

Ball grid array re-work assembly with X-ray inspection system

X-ray or gamma ray systems or devices – Specific application – Absorption

Ball grid array X-ray orientation mark

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Beam centering and angle calibration for X-ray reflectometry

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Beam conditioning system

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Beam conditioning system with sequential optic