X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1993-12-17
1996-06-04
Porta, David P.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 84, G21K 106
Patent
active
055240402
ABSTRACT:
A 4-bounce dispersive crystal monochromator reduces the bandpass of synchrotron radiation to a 10-50 meV range without sacrificing angular acceptance. The monochromator includes the combination of an asymmetrical channel-cut single crystal of lower order reflection and a symmetrical channel-cut single crystal of higher order reflection in a nested geometric configuration. In the disclosed embodiment, a highly asymmetrically cut (.alpha.=20) outer silicon crystal (4 2 2) with low order reflection is combined with a symmetrically cut inner silicon crystal (10 6 4) with high order reflection to condition a hard x-ray component (5-30 keV) of synchrotron radiation down to the .mu.eV-neV level. Each of the crystals is coupled to the combination of a positioning inchworm and angle encoder via a respective rotation stage for accurate relative positioning of the crystals and precise energy tuning of the monochromator.
REFERENCES:
patent: 4567605 (1986-01-01), Bartels
patent: 5199058 (1993-03-01), Tani et al.
patent: 5245648 (1993-09-01), Kinney et al.
Eastman et al., "Easily Tunable Monochromator for 5eV .ltorsim. Wavelength .ltorsim. 1000 eV Synchroton Radiation", IBM Tech. Disclosure Bulletin, vol. 19, No. 11, Apr. 1977, pp. 4477-4478.
Construction of a Precision Diffractometer for Nuclear Bragg Scattering at the Photon Factory in Rev. Sci. Instrum., 63(1), Jan. 1992, by Ishikawa et al.
New Apparatus for the Study of Nuclear Bragg Scattering, Nuclear Instruments and Methods in Physics Research, A266 (1988), 329-335, by Siddons et al.
Alp Ercan E.
Mooney Timothy M.
Toellner Thomas
Glenn Hugh
Moser William R.
Porta David P.
Smith Bradley W.
The United States of America as represented by the United States
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