X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1993-04-15
1994-09-27
Porta, David P.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 45, 378 47, 378208, G01N 2320
Patent
active
053512812
ABSTRACT:
A double open-ended sample holder for sample material for X-ray spectroscopic analysis including a cylindrical body containing the sample material and having top and bottom open faces. An analytic film is mounted tautly across the lower face, and a microporous film positioned across the upper face cell passes gases generated by X-rays striking the sample material but does not pass harmful particle materials contained in the cell. Upper and lower rings mounted to the cylindrical body secure the lower and upper films to the body. A handling support connected to the top securing ring provides a grip for a tool used in the process of remotely raising or lowering the sample holder relative to placement into or removal from an X-ray cassette. The handling support is spaced from the microporous film so that gases generated in the cell are allowed to escape across the microporous film at a maximum rate of evacuation.
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Torrisi Angelo M.
Urbano Roland
Porta David P.
Sutton Paul J.
Torrisi Angelo M.
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