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Voltage-controlled oscillator, phase-locked loop, and memory...

Static information storage and retrieval – Read/write circuit – Sipo/piso
Reexamination Certificate

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Voltage-dependent delay

Static information storage and retrieval – Read/write circuit – Signals
Patent

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Voltage-level shifter and semiconductor memory using the same

Static information storage and retrieval – Read/write circuit – Including level shift or pull-up circuit
Reexamination Certificate

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Voltage-level shifter and semiconductor memory using the same

Static information storage and retrieval – Read/write circuit – Including level shift or pull-up circuit
Reexamination Certificate

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VPP power supply having a regulator circuit for controlling a re

Static information storage and retrieval – Read/write circuit – Including reference or bias voltage generator
Patent

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VPX bank architecture

Static information storage and retrieval – Read/write circuit – Differential sensing
Reexamination Certificate

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Wafer burn-in circuit for a semiconductor memory device

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Wafer burn-in test and wafer test circuit

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Wafer burn-in test and wafer test circuit

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Wafer burn-in test circuit and a method thereof

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Wafer burn-in test circuit and method for testing a semiconducto

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Wafer burn-in test circuit and method for testing a...

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Wafer burn-in test circuit of a semiconductor memory device

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Wafer burn-in test circuit of a semiconductor memory device

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Wafer level burn-in for memory integrated circuit

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Wafer level burn-in of memory integrated circuits

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Wafer level burn-in of SRAM

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Wafer test method capable of completing a wafer test in a short

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Wafer-scale integrated circuit memory

Static information storage and retrieval – Read/write circuit
Patent

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Waveform stabilizing drive circuit for modularized memory

Static information storage and retrieval – Read/write circuit – Having particular data buffer or latch
Patent

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