Static information storage and retrieval – Read/write circuit – Testing
Patent
1997-09-23
2000-02-15
Nelms, David
Static information storage and retrieval
Read/write circuit
Testing
365210, 36523006, G11C 700
Patent
active
060260386
ABSTRACT:
A wafer burn-in test circuit of a semiconductor memory device having a plurality of memory cells arranged in a row/column matrix, is provided, including: a sub word line driver connected to first and second word line groups each connected to true cells and complement cells forming the memory cells, and responding to a predecoded low address; and first and second power lines respectively supplying power to the corresponding first and second power line groups by a switching operation of the sub word line driver, wherein a ground power source is applied to the first and second power lines during a normal operation, and the ground power source and a step-up power source are alternately applied to the first and second power lines during a wafer burn-in test operation.
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"Printout from Dialog Database".
Cho Soo-In
Choi Jong-Hyun
Nelms David
Nguyen Vanthu
Samsung Electronics Co,. Ltd.
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