Reduction of shrinkage of poly(arylene ether) for low-K IMD
Reduction of silicon defect induced failures as a result of impl
Reduction of surface contamination in post-CMP cleaning
Reduction of surface defects on amorphous silicon grown by a...
Reduction of surface leakage current by surface passivation...
Reduction of surface roughness during chemical mechanical...
Reduction of surface roughness during chemical mechanical...
Reduction of the aspect ratio of deep contact holes for...
Reduction of the shear stress in copper via's in organic...
Reduction of threading dislocations by amorphization and recryst
Reduction of tungsten damascene residue
Reduction of tungsten silicide resistivity by boron ion...
Reduction of via etch charging damage through the use of a...
Reduction of via over etching for borderless contacts
Reduction of watermarks in HF treatments of semiconducting...
Redundancy mapping in a multichip semiconductor package
Redundancy structure in self-aligned contact process
Reel-deployed printed circuit board and method for...
Reference data coding in solid state image sensors
Reference layer structure in a magnetic storage cell