Test key for monitoring gate conductor to deep trench...

Test pads on flash memory cards

Test pattern structure for measuring misalignment in semiconduct

Test patterns and methods of controlling CMP process using...

Test patterns for measurement of effective vacancy diffusion...

Test photomask and method for investigating ESD-induced...

Test photomask and method for investigating ESD-induced...

Test structure and method for determining metal-oxide-silicon fi

Test structure and method for flash memory tunnel oxide quality

Test structure and method for yield improvement of double...

Test structure for detecting bridging of DRAM capacitors

Test structure for determining a short circuit between...

Test structure for differentiating the line and via...

Test structure for high precision analysis of a semiconductor

Test structures and methods

Test structures and methods for inspection of semiconductor...

Test structures for electrical linewidth measurement and...

Test structures for silicon etching

Test structures for testing planarization systems and...

Test structures in unused areas of semiconductor integrated...