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Method and system for controlling focused ion beam alignment...

Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices
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Method and system for determining pressure compensation...

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Method and system for dose control during an ion...

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Method and system for electron beam lithography

Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices
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Method and system for exposing an exposure pattern on an object

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Method and system for exposing pattern on object by charged part

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Method and system for ion beam containment in an ion beam guide

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Method and system for ion beam containment in an ion beam guide

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Method and system for ion beam containment using...

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Method and system for logic design for cell projection...

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Method and system for microwave excitation of plasma in an...

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Method and system for operating a variable aperture in an...

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Method and system for proximity effect and dose correction...

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Method and system for single ion implantation

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Method and system of monitoring E-beam overlay and providing...

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Method apparatus for a coaxial optical microscope with...

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Method capable of accurately simulating ion implantation at a hi

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Method for adjusting a semiconductor disk relative to a radiatio

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Method for analyzing radiation sensitivity of integrated circuit

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Method for cleaning a lithographic apparatus module, a...

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