Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices
Reexamination Certificate
2006-12-01
2009-08-25
Vanore, David A (Department: 2881)
Radiant energy
Irradiation of objects or material
Irradiation of semiconductor devices
C250S492100, C250S492200, C250S492230, C716S030000, C716S030000
Reexamination Certificate
active
07579606
ABSTRACT:
A method for particle beam lithography, such as electron beam (EB) lithography, includes predefining a stencil design having a plurality of cell patterns with information from a cell library, fabricating the stencil design, synthesizing a functional description into a logic circuit design after predefining the stencil design so that one or more characteristics of the stencil design are considered during synthesizing of the functional description into the logic circuit design, optimizing the logic circuit design, generating a layout design from the optimized logic circuit design, and forming the logic circuit on a substrate according to the stencil design and the layout design.
REFERENCES:
patent: 5350704 (1994-09-01), Anderson et al.
patent: 6560768 (2003-05-01), Inanami et al.
patent: 6718532 (2004-04-01), Inanami et al.
patent: 6782524 (2004-08-01), Rittman
patent: 2001/0028991 (2001-10-01), Inanami et al.
patent: 2002/0010905 (2002-01-01), Inanami et al.
patent: 2002/0010906 (2002-01-01), Inanami et al.
patent: 2008/0116399 (2008-05-01), Fujimura et al.
Sugihara et al, “Technology mapping technique for throughput enhancement of character projection equipment”, Proceedings Spie 6151 61510Z (2006), Spie, Box 10, Bellingham, Wa 98227. (Paper attached: file name “PSISDG—6151—1—61510Z—1.pdf”).
Hattori, K. et al., “Electron Beam Direct Writing System Ex-8D Employing Character Projection Exposure Method”, Journal of Vacuum Science Technology, Vol. B11(6) (1993), pp. 2346-2351, 1993, American Vacuum Society, 125 Maiden Lane, 15th Floor, New York, Ny 10038. (Paper attached: file name “electron—bearn.pdf”).
Hara, S. et al., “Character Projection EB Data Conversion System Combined with Throughput Analyzer”, Japanese Journal of Applied Physics, Vol. 33 (1994), pp. 6935-6939, Japan Society of Applied Physics, Kudan-Kita building 5th floor, Kudan-Kita 1-12-3, Chiyoda-ku, Tokyo 102-0073, Japan. (Paper attached: file name “character—projection.pdf”).
Nakasugi, T. et al. “Maskless Lithography Using Low Energy Electron Beam: Recent Results of Proof-of-Concept Tool”, Journal of Vacuum Science Technology, Vol. B20(6) (2002), pp. 2651-2656, American Vacuum Society, 125 Maiden Lane, 15th Floor, New York, Ny 10038. (Paper attached: file name “maskless.pdf”).
Fujino, T. et al., “Character-Build Standard-Cell Layout Technique for High-Throughput Character-Projection EB Lithography”, Proceedings Spie Vol. 5853 (2005), pp. 161-167, Spie, Box 10, Bellingham, Wa 98227. (Paper attached: “character—built.pdf”).
Kazama, T. et al., “Shot reduction technique for character projection lithography using combined cell stencil”, Proceedings Spie Vol. 5992, 59922V (2005), Spie, Box 10, Bellingham, Wa 98227. (Paper attached: file name “shot. pdf”).
Fujimura Akira
Matsushita Shohei
Mitsuhashi Takashi
Yoshida Kenji
D2S, Inc.
Ippolito Rausch Nicole
The Mueller Law Office, P.C.
Vanore David A
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