Search
Selected: L

Lithographic apparatus, method of exposing a substrate,...

Optics: measuring and testing – Dimension – Thickness
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Lithographic apparatus, overlay detector, device...

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Lithographic apparatus, position quantity detection system...

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Lithographic lens wavefront and distortion tester

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Lithographic mask structure and device for positioning the same

Optics: measuring and testing – Angle measuring or angular axial alignment – Sides of angle or axes being aligned transverse to optical...
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Lithography alignment

Optics: measuring and testing – By alignment in lateral direction – With registration indicia
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Lithography apparatus with filters for optimizing uniformity...

Optics: measuring and testing – By alignment in lateral direction – With light detector
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Lithography for optical patterning of fluids

Optics: measuring and testing – Velocity or velocity/height measuring – With light detector
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Lithography line width monitor reflecting chip-wide average...

Optics: measuring and testing – Dimension – Width or diameter
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Lithography mask inspection

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Lithography system using quantum entangled photons

Optics: measuring and testing – By light interference
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Lithography tool test patterns and method

Optics: measuring and testing – Lens or reflective image former testing
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Lithography using quantum entangled particles

Optics: measuring and testing – By light interference
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Lithography using quantum entangled particles

Optics: measuring and testing – By light interference
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Lithotripter reflector inspection

Optics: measuring and testing – Lens or reflective image former testing – For optical transfer function
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Littrow interferometer

Optics: measuring and testing – By light interference – For dimensional measurement
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Littrow spectrometer and a spectral domain optical coherence...

Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Reexamination Certificate

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Live cell chamber for microscopes

Optics: measuring and testing – Range or remote distance finding – With photodetection
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Liver function testing apparatus

Optics: measuring and testing – Blood analysis
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Liver function testing apparatus

Optics: measuring and testing – Blood analysis
Patent

  [ 0.00 ] – not rated yet Voters 0   Comments 0
  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.