Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Reexamination Certificate
2005-08-03
2008-11-25
Geisel, Kara E (Department: 2877)
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
Reexamination Certificate
active
07456957
ABSTRACT:
A compact conical diffraction Littrow spectrometer is disclosed. The distortion of the conically diffracted spectral component beams is compensated and as a result, the diffracted spectral beams can still be focused into a substantially straight line to shine onto a detector array. A spectral domain optical coherence tomography (SD-OCT) system incorporating a Littrow spectrometer or a spectrometer having one or more shared focusing element(s) and an SD-OCT system incorporating a spectrometer that is substantially polarization independent are also disclosed.
REFERENCES:
patent: 5565986 (1996-10-01), Knüttel
patent: 5757483 (1998-05-01), Pierce, III
patent: 6362879 (2002-03-01), Ranalli
patent: 6487019 (2002-11-01), Hoose
patent: 6570652 (2003-05-01), Cappiello
patent: 6577786 (2003-06-01), Cappiello et al.
patent: 6628383 (2003-09-01), Hilliard
patent: 6657727 (2003-12-01), Izatt et al.
patent: 6710330 (2004-03-01), Tagami et al.
patent: 6724533 (2004-04-01), Hoose et al.
patent: 6754006 (2004-06-01), Barton et al.
patent: 6757113 (2004-06-01), Basavanhally et al.
patent: 6813019 (2004-11-01), Hammer et al.
patent: 6847454 (2005-01-01), Crowley et al.
patent: 6859317 (2005-02-01), Cappiello et al.
patent: 7034935 (2006-04-01), Kruzelecky
patent: 2001/0048526 (2001-12-01), Bender
patent: 2001/0052980 (2001-12-01), Tada
patent: 2002/0054289 (2002-05-01), Thibault et al.
patent: 2003/0016355 (2003-01-01), Koike et al.
patent: 2004/0196458 (2004-10-01), Shimizu et al.
patent: 2004/0239938 (2004-12-01), Izatt
patent: 2004/0239943 (2004-12-01), Izatt et al.
patent: 2005/0018201 (2005-01-01), de Boer et al.
patent: 2006/0072424 (2006-04-01), Everett et al.
patent: 2 476 174 (2003-09-01), None
patent: 1168325 (1969-10-01), None
patent: 2000-46729 (2000-02-01), None
patent: 2001-174404 (2001-06-01), None
patent: WO 03/062802 (2003-07-01), None
patent: WO 2004/043245 (2004-05-01), None
J.F. de Boer et al., Improved signal-to-noise ratio in spectral-domain compared with time-domain optical coherence tomography,Optics Letters, vol. 28, No. 21, Nov. 1, 2003, pp. 2067-2069.
M.A. Choma et al., “Sensitivity advantage of swept source and Fourier domain optical coherence tomography,”Optics Express, vol. 11, No. 18, Sep. 8, 2003, pp. 2183-2189.
R.A. Leitgeb et al., “Phase-shifting algorithm to achieve high-speed long-depth-range probing by frequency-domain optical coherence tomography,”Optics Letters, vol. 28, No. 22, Nov. 15, 2003.
R. Leitgeb et al., “Performance of fourier domain vs. time domain optical coherence tomography,”Optics Express, vol. 11, No. 8, Apr. 21, 2003, pp. 889-894.
D. Maystre et al., “Geometrical invariance property of gratings,”Applied Optics, vol. 24, No. 2, Jan. 15, 1985, pp. 215-216.
T. Matsui, “Dynamic Range of Optical Reflectometry with Spectral Interferometry,”Jpn. J. Appl. Phys., vol. 38, Part 1, No. 10, Oct. 1999, pp. 6133-6137.
E. Popov et al., “Almost perfect blazing by photonic crystal rod gratings,”Applied Optics, vol. 40, No. 15, May 20, 2001, pp. 2417-2422.
L. M. Smith et al., “Absolute displacement measurements using modulation of the spectrum of white light in a Michelson interferometer,”Applied Optics, vol. 28, No. 15, Aug. 15, 1989, pp. 3339-3342.
M. Wojtkowski et al., “Real-time in vivo imaging by high-speed spectral optical coherence tomography,”Optics Letters, vol. 28, No. 19, Oct. 1, 2003, pp. 1745-1747.
I. Zeylikovich et al., “Nonmechanical grating-generated scanning coherence microscopy,”Optics Letters, vol. 28, No. 23, Dec. 1, 1998, pp. 1797-1799.
Brochure, Laser & ASE Systems, “Rapid Scan Tunable Lasers,”Thorlab Inc. Product Catalog, vol. 17 (2005), 1 page in length.
Everett Matthew J.
Foley James P.
Horn Jochen M. M.
O'Hara Keith
Zhou Yan
Carl Zeiss Meditec Inc.
Geisel Kara E
Stallman & Pollock LLP
LandOfFree
Littrow spectrometer and a spectral domain optical coherence... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Littrow spectrometer and a spectral domain optical coherence..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Littrow spectrometer and a spectral domain optical coherence... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4027542