Lithotripter reflector inspection

Optics: measuring and testing – Lens or reflective image former testing – For optical transfer function

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128 24EL, 606 2, G01B 900, A61H 100

Patent

active

050569171

ABSTRACT:
Structure is provided for inspecting a lithotripter ellipsoidal reflector. In one form of the invention a narrow light beam such as a laser light beam is projected through the first focus point of the reflector as relfects on to a target on the axis of reflection, thereby indicating visually the location of the second focus point. The target preferably is a rod lying on the axis of rotation. Preferably the light source is movable in a vertical plane, and the reflector is rotatable about its axis of rotation to provide redundancy in location of the second focus point. In a further form of the invention the target comprises a photocell so that the accuracy and reflectivity of the reflecting surface can be measured.

REFERENCES:
patent: 4930509 (1990-06-01), Brisson
patent: 4932954 (1990-06-01), Wondrazek et al.
patent: 4966132 (1990-10-01), Nowacki et al.
Webster's New World Dictionary, Neufeldt et al, 1988, p. 997.

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