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High speed testing of electronic circuits by electro-optic sampl

Optics: measuring and testing – By polarized light examination
Patent

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High speed three dimensional imaging method

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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High speed three dimensional imaging method

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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High transmission multi-wavelength filter and method

Optics: measuring and testing – By polarized light examination – With polariscopes
Reexamination Certificate

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High-accuracy high-stability method and apparatus for measuring

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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High-precision reflectometer

Optics: measuring and testing – By polarized light examination – Of surface reflection
Patent

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High-resolution compact optical sensor for scanning three-dimens

Optics: measuring and testing – By polarized light examination – With light attenuation
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High-sensitivity reflection measurement apparatus

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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High-speed 3-D surface measurement surface inspection and revers

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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High-speed polarizing device and high-speed birefringence...

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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High-throughput chiral detector and methods for using same

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Highlighted panel inspection

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Highly accurate calibration of polarimeters

Optics: measuring and testing – By polarized light examination – With polariscopes
Reexamination Certificate

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Highly accurate in-situ determination of the refractivity of an

Optics: measuring and testing – By polarized light examination – With birefringent element
Patent

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Highly accurate three-dimensional surface digitizing system and

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Hole centration gage

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Horizontal attenuated total reflection system

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Horizontal attenuated total reflection system

Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate

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Hot kiln alignment system

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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Hybrid confocal microscopy

Optics: measuring and testing – By polarized light examination – With light attenuation
Patent

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