High speed testing of electronic circuits by electro-optic sampl

Details High speed testing of electronic circuits by electro-optic sampl High speed testing of electronic circuits by electro-optic sampl

1984-09-07

1987-07-21

Rosenberger, R. A.

Optics: measuring and testing

By polarized light examination

356365, 324 77K, G01J 400

Patent

active

046814493

ABSTRACT:
Non-contact measurement of signals up to and beyond 100 GHz is provided by electro-optical sampling the field in a transmission line. A first laser signal is employed to optically generate signals in a III-V compound semiconductor such as gallium arsenide. The signal is transmitted to microstrip on the semiconductor surface, and a second polarized laser signal is passed through the crystal and its polarization is modulated by the electric field in the microstrip. The polarization presents a measure of the field strength and hence the signal. By varying the relative delay between two beams, an equivalent time representation of the sampled signal is obtained.

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