Optics: measuring and testing – By polarized light examination – With birefringent element
Patent
1991-07-01
1993-06-08
Turner, Samuel A.
Optics: measuring and testing
By polarized light examination
With birefringent element
356352, G01B 902
Patent
active
052184269
ABSTRACT:
A highly accurate in-situ determination of the refractivity of an ambient atmosphere is disclosed, which determination is utilizable to enhance the accuracy of a quantity measurement. The system includes use of a refractometer exposed to an ambient atmosphere and having light directed thereto to form an optical interference fringe pattern having a dependence upon the refractivity of the ambient atmosphere. The fringe pattern is measured as a function of angle either by sequentially scanning a collimated input beam in angle while collecting and detecting the transmitted light, or by imaging (onto a multi-element detector) the angular exit space of the interferometer illuminated with a diverging input beam. The electrical output of the detector is processed to provide an output indicative of the index of refraction of the ambient atmosphere. The determined index of refraction is utilizable to enhance the accuracy of a quantity measurement, such as, for example, the distance measurement provided by a Fabry-Perot or displacement-measuring Michelson interferometer.
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Eickhoff Mark L.
Hall John L.
Martin Peter J.
Winters Michael P.
Burdick Harold A.
The United States of America as represented by the Secretary of
Turner Samuel A.
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