Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1997-09-09
2000-04-18
Rosenberger, Richard A.
Optics: measuring and testing
By polarized light examination
With light attenuation
356 511, G01B 1124
Patent
active
060521902
ABSTRACT:
A distance-measuring system includes a light source for transmitting a beam of light to a target, thereby generating a received beam. A calibration unit periodically calibrates the system by positioning a calibration target between the light source and the target so that the transmitted beam is interrupted, thereby generating a received calibration beam. The calibration unit also generates a calibration signal which is indicative of when the calibration target is generating the received calibration beam. A target sensor receives the reflected target and calibration beams and provides a target signal indicative of the reflected target and calibration beams. A reference sensor receives light from the light source and provides a reference signal to the processing circuitry. Processing circuitry receives the calibration, target, and reference signals and calculates the distance to the target based upon the target and reference signals and/or calibrates the system based upon the calibration signal. The processing circuitry may provide data based upon the calibration and target signals to a computer for distance calculations and calibration. A beam splitter may be provided between the light source and the target to allow the transmitted beam to be incident on the target while deflecting the received beam to be incident on the target sensor, so that the light transmitted to the target and reflected back to the target sensor is substantially coaxial.
REFERENCES:
patent: 3619058 (1971-11-01), Hewlett et al.
patent: 3649123 (1972-03-01), Ulicki
patent: 3730628 (1973-05-01), Wolcott et al.
patent: 3778159 (1973-12-01), Hines et al.
patent: 3778160 (1973-12-01), Wolcott
patent: 4005936 (1977-02-01), Redman et al.
patent: 4163954 (1979-08-01), Hayes
patent: 4165936 (1979-08-01), Eisenring et al.
patent: 4537502 (1985-08-01), Miller et al.
patent: 4594000 (1986-06-01), Falk et al.
patent: 4639129 (1987-01-01), Hullein et al.
patent: 4743110 (1988-05-01), Arnaud et al.
patent: 4895441 (1990-01-01), Allen, Jr.
patent: 4942561 (1990-07-01), Ohishi et al.
patent: 4957365 (1990-09-01), Brinkmeyer
patent: 5029999 (1991-07-01), Kremer et al.
patent: 5114226 (1992-05-01), Goodwin et al.
patent: 5164733 (1992-11-01), Nettleton et al.
patent: 5194906 (1993-03-01), Kimura et al.
patent: 5241360 (1993-08-01), Key et al.
patent: 5262836 (1993-11-01), Nourrcier
patent: 5285252 (1994-02-01), Vareille et al.
patent: 5534992 (1996-07-01), Takeshima et al.
patent: 5737085 (1998-04-01), Zollars et al.
patent: 5790242 (1998-08-01), Stern et al.
patent: 5831719 (1998-11-01), Berg et al.
The Frequency-Modulated Laser Tank Guage: Designing a Practical System; Sensors, Sep. 1996; pp. 16-26.
The Technology Behind 3D Digitizing; Computer Graphics World; Mar. 1997; pp. 47-52.
Hardy James M.
Sekowski Marek
Summers Thomas
Rosenberger Richard A.
Utoptics, Inc.
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