High-throughput chiral detector and methods for using same

Details High-throughput chiral detector and methods for using same High-throughput chiral detector and methods for using same

2007-11-27

2007-11-27

Punnoose, Roy M. (Department: 2886)

Optics: measuring and testing

By polarized light examination

Of surface reflection

C356S367000

Reexamination Certificate

active

10491094

ABSTRACT:
A new generation polarimetry apparatus and methodology is disclosed, which involve passing polarized light through a sample including a chiral analyte, where the analyte is under the influence of a periodically varying magnetic field. The apparatus also utilizes optical heterodyne detection and lock-in detection at higher order harmonics of the magnetic field modulation frequency to improve sensitivity and detection limits of optical properties of chiral analytes.

REFERENCES:
patent: 6046805 (2000-04-01), Kawamura et al.
patent: 6166807 (2000-12-01), Kawamura et al.
patent: 6466320 (2002-10-01), Kawamura et al.
patent: 6620622 (2003-09-01), Kawamura
patent: 6750063 (2004-06-01), Kawamura

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