Performing retardation measurements

Details Performing retardation measurements Performing retardation measurements

2006-07-11

2006-07-11

Nguyen, Tu T. (Department: 2877)

Optics: measuring and testing

By polarized light examination

Reexamination Certificate

active

07075648

ABSTRACT:
Some embodiments include a system having a polarizer and an analyzer.

REFERENCES:
patent: 4749854 (1988-06-01), Martens
patent: 4801798 (1989-01-01), Lange
patent: 4973163 (1990-11-01), Sakai et al.
patent: 5257092 (1993-10-01), Noguchi et al.
patent: 5406371 (1995-04-01), Sakai et al.
patent: 5450200 (1995-09-01), Imagawa
patent: 5504581 (1996-04-01), Nagata et al.
patent: 5825492 (1998-10-01), Mason
patent: 5864403 (1999-01-01), Ajji et al.
patent: 5917598 (1999-06-01), Mason
patent: 6034774 (2000-03-01), Marcus et al.
patent: 6055053 (2000-04-01), Lesniak
patent: 6268914 (2001-07-01), Wang
patent: 6473179 (2002-10-01), Wang et al.
patent: 6473181 (2002-10-01), Oakberg
patent: 6693711 (2004-02-01), Leger et al.
patent: 6697157 (2004-02-01), Wang et al.
patent: 6738137 (2004-05-01), Oakberg
patent: 6822737 (2004-11-01), Kurata et al.
patent: 2004/0125373 (2004-07-01), Oldenbourg et al.

Affiliated with

Also associated with

Rating

Performing retardation measurements does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Performing retardation measurements, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Performing retardation measurements will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3548718