Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1991-04-08
1992-07-28
Evans, F. L.
Optics: measuring and testing
By polarized light examination
With light attenuation
356364, G01B 1100
Patent
active
051336022
ABSTRACT:
A bright-field, particle position determining optical system is disclosed that uses both phase shift and extinction signals to determine particle trajectories. In a first embodiment, a pair of orthogonally polarized beams are positioned along an axis that intersects a particle's flow path at an acute angle. An optical system recombines the beams after they exit the flow path, the combined beams manifesting an elliptical polarization if a particle intersects one of the beams. Bright field detectors detect polarization components of the combined beam, provide a phase shift signal between the beam's orthogonal components and provide corresponding signals to a processor. The processor determines a signal asymmetry from the phase shift signal that is indicative of a particle's position in the flow path. Another embodiment of the invention examines a signal resulting from the beam's phase shift and determines a correction factor that is dependent upon the distance of the particle from the focal plane of the beams. Another embodiment employs a dithering system for cyclically moving one or more optical beams across a particle to further enable its trajectory or position to be determined.
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Batchelder John S.
DeCain Donald M.
Hobbs Philip C. D.
Taubenblatt Marc A.
Evans F. L.
International Business Machines - Corporation
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