Method of correcting azimuth angle of photometric ellipsometers

Method of determining bulk refractive indicies of fluids...

Method of determining bulk refractive indicies of liquids...

Method of determining initial thickness value for sample...

Method of determining initial thickness value for sample...

Method of evaluating an anisotropic thin film and an...

Method of inspecting grain size of a polysilicon film

Method of measuring small pads on a substrate

Method of measuring surface form of semiconductor thin film

Method of measuring surface form of semiconductor thin film

Method of measuring surface reflectance and a method of producin

Method of measuring thickness of a multi-layers film

Method of monitoring a laser crystallization process

Method of monitoring ion implants by examination of an...

Method of monitoring the fabrication of thin film layers...

Method of performing optical measurement on a sample

Method of reducing the effect of noise in determining the...

Methodology for providing good data at all wavelengths over...

Methods and apparatus for analyzing mirror reflectance

Methods and apparatus for measuring an electromagnetic...