Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate
2007-12-11
2007-12-11
Pham, Hoa Q. (Department: 2886)
Optics: measuring and testing
By polarized light examination
Of surface reflection
Reexamination Certificate
active
10794204
ABSTRACT:
A method of reducing the effect of systematic and/or random noise during determination of dependent variable values, (eg. pseudo “n” and “k” and/or ellipsometric PSI and DELTA or mathematical equivalent vs. wavelength or angle of incidence), involving selecting a mathematical function and an independent variable subset range combination so that a square error best fit with total summed square error over the independent variable subset range being minimized, zero or within an acceptable range near zero, are achieved.
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Johs Blaine D.
Liphardt Martin M.
J.A. Woollam Co. Inc.
Pham Hoa Q.
Welch James D.
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