Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate
2007-03-20
2007-03-20
Nguyen, Tu T. (Department: 2877)
Optics: measuring and testing
By polarized light examination
Of surface reflection
Reexamination Certificate
active
10965240
ABSTRACT:
Methods and apparatus for measuring an electromagnetic radiation response property associated with a substrate are disclosed. The methods and apparatus generate electromagnetic waves and capture a portion of the generated waves after the waves pass through a first polarized filter, reflect from a substrate, and pass through a second polarized filter arranged in a cross polar arrangement with respect to the first polarized filter. Digital data is determined from the captured electromagnetic waves. Based on the digital data, the customer is given certain choices and/or informed of certain personal care product recommendations.
REFERENCES:
patent: 4555179 (1985-11-01), Langerholc et al.
patent: 5363854 (1994-11-01), Martens et al.
patent: 6175750 (2001-01-01), Cook et al.
patent: 6809809 (2004-10-01), Kinney et al.
patent: 2002/0087085 (2002-07-01), Dauga et al.
patent: 2002/0095075 (2002-07-01), Madarasz et al.
patent: 2003/0139672 (2003-07-01), Cane et al.
patent: 2004/0008343 (2004-01-01), Pawluczyk et al.
patent: 2004/0078278 (2004-04-01), Dauga et al.
patent: 2004/0092802 (2004-05-01), Cane et al.
patent: 2004/0169857 (2004-09-01), Acosta et al.
patent: 2006/0082764 (2006-04-01), Sottery et al.
patent: 2006/0085274 (2006-04-01), Sottery et al
patent: WO 99/05961 (1999-02-01), None
patent: WO 01/41632 (2001-06-01), None
patent: WO 2004/060105 (2002-07-01), None
patent: WO 03/073077 (2003-09-01), None
PCT International Search Report, dated mailed: Feb. 8, 2006, 7 pages.
LaFleur Patricia Alison
Sekas Mark
Sottery John Phelps
Addington Eric T.
Innovative Measurement Solutions, Inc.
Kendall Dara M.
Nguyen Tu T.
The Procter & Gamble & Company
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