Optics: measuring and testing – By polarized light examination – Of surface reflection
Reexamination Certificate
2004-11-24
2008-05-06
Lauchman, Layla G. (Department: 2877)
Optics: measuring and testing
By polarized light examination
Of surface reflection
C356S366000, C356S364000, C250S225000
Reexamination Certificate
active
07369234
ABSTRACT:
The invention relates to a method of performing an optical measurement on a sample, such as an ellipticity measurement. The sample is irradiated with a polarized irradiation beam and a return beam is linearly polarized. The irradiation or return beam is modulated with a birefringence modulator, such as a photoelastic modulator, in accordance with a primary modulation signal. The return beam is directed onto a multichannel detector. Typically the detector is a slow detector, such as a CCD, having a response time greater than a period of the primary modulation signal. Detection values are generated simultaneously at each detection element and processed to determine a plurality of measurements. Various measurement techniques are described, including detector signal averaging over gated intervals; a design employing coherent modulation of the gain of an ICCD , and a modulator-coherent flash lamp design.
REFERENCES:
patent: 5286968 (1994-02-01), Fournier et al.
patent: 5501637 (1996-03-01), Duncan et al.
patent: 5617203 (1997-04-01), Kobayashi et al.
patent: 5757671 (1998-05-01), Drevillon et al.
patent: 5838441 (1998-11-01), Satorius et al.
patent: 5929994 (1999-07-01), Lee et al.
patent: 6134012 (2000-10-01), Aspnes et al.
patent: 6608717 (2003-08-01), Medford et al.
patent: 6714301 (2004-03-01), Otsuki et al.
patent: 6856391 (2005-02-01), Garab et al.
patent: 6940602 (2005-09-01), Dubois et al.
patent: 7064828 (2006-06-01), Rovira et al.
Full-field optical coherence microscopy, E. Beaurepaire, A. C. Boccara, M. Lebec, L. Blanchot, and H. Saint-Jalmes, Optics Letters vol. 23, Feb. 1998, p. 244-246.
Real-time reflectivity and topography imagery of depth-resolved microscopic surfaces, A. Dubois, A. C. Boccara, and M. Lebec, Optics Letters, vol. 24, Mar. 1990, p. 309-311.
Optical Shop Testing, Daniel Malacara, 1978, Wiley, sections 13.1-13.2.
Charge-coupled device image sensor as a demodulator in a 2-D polarimeter with a piezoelastic modulator, Hanspeter Povel, Hans Aebersold, and Jan O. Stenflo, Applied Optics, vol. 29, No. 8, Mar. 10, 1990, p. 1186-1190.
The Lock-In CCD—Two Dimensional Synchronous Detection of Light, T. Spirig, P. Seitz, O. Vietze, and F. Heitger, IEEE Journal of Quantum Electronics, vol. 31, No. 9, Sep. 1995, p. 1705-1708.
Digital Wavefront Measuring Interferometer for Testing Optical Surfaces and Lenses, J. H. Bruning, D. R. Herriott, J. E. Gallagher, D. P. Rosenfeld, A. D. White, and D. J. Brangaccio, Applied Optics, vol. 13, No. 11, Nov. 1974, p. 2693-2703.
D. Beaglehole, “The Imaging Ellipsometer,” Dec. 2003, Salamanca Group, No. 716, p. 2.
D. Beaglehole, “Performance of a microscopic imaging ellipsometer,” 1998, Rev. Sci. Instrum. 59(12). 2557. 3 pp.
E. Beaurepaire et al., “Optical coherence microscopy for the in-depth study of biological structures: system based on a parallel detection scheme,” SPIE—Proceedings of Optical Biopsy II, 1998, vol. 3250, pp. 201-208.
Harrington & Smith PC
Lauchman Layla G.
Rudolph Technologies, Inc.
Skovholt Jonathan
LandOfFree
Method of performing optical measurement on a sample does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of performing optical measurement on a sample, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of performing optical measurement on a sample will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3985557