Sample analysis method

Sample entry purge system in spectrophotometer,...

Sample investigating system

Scatterometry to simultaneously measure critical dimensions...

Search routine for ellipsometers

Self aligning in-situ ellipsometer and method of using for proce

Self-calibrating beam profile ellipsometer

Semiconductor surface measurement system and method

Semiconductor test apparatus

Sensitive polarization monitoring and controlling

Sensor for water film on a plate in printing machines

Simultaneous multiple angle/multiple wavelength ellipsometer and

Single polarizer focused-beam ellipsometer

Small modulation ellipsometry

Small spot ellipsometer

Small spot ellipsometer

Small spot ellipsometer

Small spot spectroscopic ellipsometer with refractive focusing

Spatial filter means comprising an aperture with a non-unity...

Spectral ellipsometer without chromatic aberrations