Methodology for providing good data at all wavelengths over...

Details Methodology for providing good data at all wavelengths over... Methodology for providing good data at all wavelengths over...

2006-12-19

2006-12-19

Toatley, Jr., Gregory J. (Department: 2877)

Optics: measuring and testing

By polarized light examination

Of surface reflection

Reexamination Certificate

active

07151605

ABSTRACT:
Disclosed is methodology for obtaining data of improved precision, including detection and replacement of data determined to be suspect to provide good data over a spectroscopic range of wavelengths.

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