Method of determining initial thickness value for sample...

Details Method of determining initial thickness value for sample... Method of determining initial thickness value for sample...

2008-04-22

2008-04-22

Punnoose, Roy M (Department: 2886)

Optics: measuring and testing

By polarized light examination

Of surface reflection

C356S630000, C250S559270

Reexamination Certificate

active

07362435

ABSTRACT:
A method of determining a starting value for thickness of the most influential layer in a mathematical model of a sample for use in a data fitting routine, supplemented by the use of ordinary or B-spline polynomials to represent at least one of the real and imaginary parts of optical constants in the mathematical model.

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