Method of measuring thickness of a multi-layers film

Optics: measuring and testing – By polarized light examination – Of surface reflection

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

356362, G01N 2141, G01N 2121

Patent

active

057841675

ABSTRACT:
A multi-layers with (m+1) sublayers is formed on a substrate. The purpose of the present invention is to measure the thickness of the sublayer (m+1) using the ellipsometry even the physical parameters of the other sublayers are unknow. The key of the method is to reguard the multi-layers (sublayer 1/sublayer 2/ . . . /sublayer m) as a reduced layer. Then the multi-layers becomes a double layers formed on a substrate, that is a sublayer (m+1) and a reduced layer. Assume that the sublayer (m+1) is composed of material M. Then the multi-layers becomes a double M layers formed on a substrate, that is a M layer and a reduced layer. A first measurement is performed to measure the thickness (T1) of the double layers by using an ellipsometry. Next, a second measurement is done to measure the thickness (T2) of the reduced layer by using an ellipsometry. The thickness of the sublayer (m+1) can be obtained by performing (T1-T2).

REFERENCES:
patent: 4906844 (1990-03-01), Hall
patent: 5420680 (1995-05-01), Isobe et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of measuring thickness of a multi-layers film does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of measuring thickness of a multi-layers film, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of measuring thickness of a multi-layers film will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1651808

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.