Method for determining the thickness of a multi-thin-layer...

Method for determining wavefront aberrations

Method for determining wavefront aberrations

Method for enhancing the measuring accuracy when determining...

Method for estimating distance between tracking type laser...

Method for estimating the optical nonlinearity of a material

Method for identifying an object

Method for in-situ monitoring of patterned substrate...

Method for interferometrically measuring an optical property...

Method for measuring a physical distance in a camera between...

Method for measuring a thickness profile and a refractive...

Method for measuring contour variations

Method for measuring interference and apparatus for...

Method for measuring physical quantity of measurement object...

Method for measuring surface profile, and apparatus using...

Method for measuring the spin in an optical fibre

Method for measuring thickness of an optical disc

Method for measuring thickness of thin film-like material...

Method for measuring two-dimensional displacement using...

Method for monitoring film thickness, a system for...